The P-FIB can be used in wide range of scientific, engineering and technological applications
Cross-sectional studies
The focussed ion beam enables access to sub-surface structures; across electrode interfaces, or within integrated circuits.
Patterning at the microscale
Rapid creation of bespoke patterned structures at the scale of hundreds of microns.
Post-service analysis
Automated 3D milling and combined imaging and spectroscopy studies, opens up insights into materials architecture and failure mechanisms. Examine changes to microstructure within the bulk or through degradation and explore the effects of cycling.
Link to PFIB applications note
